JPK NanoWizard 4a Atomic Force Microscope (currently unavailable until a new facility director is identified)

  • The NanoWizard combines atomic resolution with fast scanning.
  • The system is capable of imaging samples in both air and liquid, including live biological samples, while also characterizing their mechanical, electrical, chemical, and magnetic properties.
  • 100 x 100 mm scan field (maximum).
  • Precise alignment of optical and AFM image (Direct Overlay).
  • Samples can be mounted on slides or 35mm dishes (click here for a list of compatible dishes).
  • Fast scanning option scans up to 100 lines/second.
  • Scanning modes include: contact mode, lateral force measurements, Qi mode (height & stiffness), non-contact mode (AC mode).

New Users

Faculty and students who wish to use the microscope should follow the instructions in the New Users Guide.

Policy

The microscope is available to trained users on an equal basis. For a comprehensive list of policies (including BSL-2 protocols), please see the Facility SOP.

System Specifications

Microscope Stand
Nikon TE200 inverted
AFM scanning modes
Contact mode, later force measurements, Qi mode (height & stiffness), non-contact mode (AC mode)
Sample Mounting
Samples can be mounted on slides or 35mm dishes (click here for a list of compatible dishes).

References

Contact Us

Dr. Aleksandr Smirnov
Associate Research Scientist
Institute for Physical Sciences  & Technology (IPST)
University of Maryland, College Park
asmirnov@umd.edu